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Topic Models
Journal Papers
The Impact of Classifier Configuration and Classifier Combination on Bug Localization
Authors
- Stephen, W. Thomas; Meiyappan, Nagappan; Dorothea, Blostein and Ahmed, E. Hassan
Preprint
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TSE
Bugs
Topic Models
2013
Conference Papers
Explaining Software Defects Using Topic Models
Authors
- Tse-Hsun, Chen; Stephen, W. Thomas; Meiyappan, Nagappan and Ahmed, E. Hassan
Preprint
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PDF
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MSR
Defect Prediction
Topic Models
2012