Topic Models

Journal Papers

1. The Impact of Classifier Configuration and Classifier Combination on Bug Localization
   Authors - Stephen, W. Thomas; Meiyappan, Nagappan; Dorothea, Blostein and Ahmed, E. Hassan
   Preprint - PDF
   Related Tags -
   • TSE
   • Bugs
   • Topic Models
   • 2013

Conference Papers

1. Explaining Software Defects Using Topic Models
   Authors - Tse-Hsun, Chen; Stephen, W. Thomas; Meiyappan, Nagappan and Ahmed, E. Hassan
   Preprint - PDF
   Related Tags -
   • MSR
   • Defect Prediction
   • Topic Models
   • 2012